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Low Temperature Test Chamber for Reliable Cold Resistance Testing
CHENDUN Low Temperature Test Chambers provide precise temperature control for evaluating material performance and product reliability under extreme cold conditions.
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Low temperature chamber

Low Temperature Test Chamber

Model: CDLT Series
Temperature Control Mode: Cooling and Heating Temperature Control
Temperature Range:Customized, Adjustable. 
Volume:50/100/150/225/408/500/800/1000L
Power: 220V, 50HZ, 1 Phase or 380V, 50HZ, 3Phase or Customized.
Temperature Fluctuation: ≤ ±0.5℃
Temperature Uniformity: ≤ ±2.0℃
Temperature Resolution: 0.1℃

Low Temperature Test Chamber Overview

The CHENDUN Low Temperature Test Chamber is designed for testing the cold resistance and reliability performance of industrial products, components and materials.

It provides a stable low-temperature environment for electronic components, automotive parts, aerospace equipment, semiconductor products and scientific research applications.

With precise temperature control and reliable refrigeration technology, the chamber helps users evaluate product durability and performance under extreme cold conditions.

Key Features

Precise Low Temperature Control

Provides stable and accurate temperature conditions for cold resistance testing and reliability evaluation.

Wide Temperature Range

Supports various temperature ranges to meet different industrial testing requirements.

Reliable Refrigeration System

Equipped with an efficient refrigeration system to maintain long-term stable operation.

Safety Protection System

Multiple protection functions ensure safe operation during continuous testing.

Industrial Testing Performance

Designed for electronics, automotive, aerospace and research applications.

Applications

Electronic Industry

Testing electronic components under low temperature conditions.

Automotive Testing

Evaluating vehicle parts and materials in cold environments.

Aerospace Research

Supporting reliability tests for aerospace components.

Semiconductor Industry

Testing semiconductor devices and precision products.

Medical & Biotechnology

Providing controlled low-temperature testing environments.

Scientific Research

Used by universities and laboratories for material studies.

Technical Specifications

Parameter Specification
Model CDLT Series Low Temperature Test Chamber
Temperature Range -20℃ ~ 0℃ / -40℃ ~ 0℃ / -60℃ ~ 0℃ / -70℃ ~ 0℃ (Optional)
Ultra Low Temperature Option -90℃ ~ -120℃ Customized
Temperature Accuracy ≤ ±0.5℃
Temperature Uniformity ≤ ±2.0℃
Temperature Control Mode Digital PID Intelligent Temperature Control
Cooling System Single Stage / Cascade Refrigeration System
Refrigerant R404A / R23
Inner Chamber Material SUS304 Stainless Steel
Insulation Layer High Density Polyurethane Foam Insulation
Observation Window Multi-layer Tempered Glass Window with Anti-frost Function
Safety Protection Over Temperature Protection, Leakage Protection, Over Current Protection
Power Supply AC 220V 50Hz / AC 380V 50Hz
Compliance Standards GB/T 2423.1 Low Temperature Test
GB/T 2423.2 High Temperature Test
GB10582-93 Technical Conditions for High and Low Temperature Test Chambers
GJB 150.3 High Temperature Test
GJB 150.4 Low Temperature Test
IEC68-2-30 Test Method

Advanced Control System

The CHENDUN Low Temperature Test Chamber adopts an intelligent PID temperature controller with high precision temperature monitoring and automatic regulation.

The system provides accurate temperature control, multiple alarm functions and parameter adjustment capabilities to ensure stable and reliable testing performance.

Precautions

• Install the equipment in a dry and well-ventilated environment.

• Avoid corrosive gases and chemical materials around the chamber.

• Ensure proper grounding before operation.

• Keep the internal chamber clean to maintain stable testing conditions.

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